An Extended Linear Hazard Regression Model with Application to Time-dependent-dielectric-breakdown of Thermal Oxides
Document Type
Article
Publication Date
4-2006
Abstract
We develop a generalized Extended Linear Hazard Regression (ELHR) model with linear time-varying coefficients to estimate reliability under normal operating conditions using failure time data obtained from accelerated conditions. The model considers the effect of proportional hazards, time-varying coefficients and also time-scale changes. Extensive simulation experiments demonstrate that the ELHR model provides more accurate reliability estimates than those obtained using existing accelerated life testing models. We utilize the ELHR model to study the time-dependent dielectric breakdown of thermal oxides on n-type 6H-SiC using laboratory data. The results show that oxide reliability considerations effectively preclude SiC MOS devices from many high-temperature applications.
Recommended Citation
Liao, Haitao; Elsayed, Elsayed A.; and Wang, Xindong, "An Extended Linear Hazard Regression Model with Application to Time-dependent-dielectric-breakdown of Thermal Oxides" (2006). Faculty Publications and Other Works -- Industrial & Information Engineering.
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