Index of refraction measurement of uranium hexafluoride vapor at 632.8 nanometers and 457.9 nanometers

Author

Sidney Paul Wright

Date of Award

8-1982

Degree Type

Thesis

Degree Name

Master of Science

Major

Physics

Major Professor

Alvin H. Nielsen

Committee Members

D. F. Smith, D. W. Magnuson, R. D. Boone

Abstract

The index of refraction of uranium hexafluoride (UF₆) vapor was measured at 632.8 nanometers and 457.9 nanometers using a Michelson interferometer. The refractive index was determined from the fringe shifts of the interference pattern as the UF₆ gas was fed into the evacuated test cell of the interferometer. Measurements were made at room temperature and at pressures ranging from 0 to 90 torr. At a confidence level of 90%, the resulting equations for the index of refraction of UF₆ vapor at the two colors are:

(n - 1) = (5.268 ± 0.010) x 10^-4 P (torr)/T (K) at 632.8 nm T (K)

and

(n - 1) = (5.414 ± 0.014) x 10^-4 P (torr)/T (K) at 457.9 nm.

A nonideality correction factor has been reported for UF₆. For the temperature and pressure range covered in this experiment, the correction factor was negligible; but for extrapolation of the data to higher pressures and temperatures, the correction factor should be included. The resulting equations are:

(n - 1) = (5.233 ± 0.010) x 10^-4 P(1 + AP)/T (K) at 632.8 nm

and

(n - 1) = (5.381 ± 0.014) x 10^-4 P(1 + AP)/T (K) 457.9 nm.

where

A(torr^-1) = 1622.1/T³ (K) .

Recommended Citation

Wright, Sidney Paul, "Index of refraction measurement of uranium hexafluoride vapor at 632.8 nanometers and 457.9 nanometers. " Master's Thesis, University of Tennessee, 1982.
https://trace.tennessee.edu/utk_gradthes/15121