Masters Theses

Date of Award

6-1988

Degree Type

Thesis

Degree Name

Master of Science

Major

Electrical Engineering

Major Professor

R. E. Bodenheimer

Committee Members

Donald W. Bouldin

Abstract

Successful manufacturers need to introduce reliable products to the marketplace in a timely manner. This need is met through efficient design-assurance testing. Design-assurance test methods for analog input devices were developed in a design-assurance environment from Winter 1984 through Autumn 1987. Industry test standards and analog input design techniques were researched. Test cycles were monitored and analyzed for efficiency. Test methods were refined to increase test coverage and decrease test cycle time. The resulting test methods comprise an efficient approach to design-assurance testing of analog input devices. Although these methods are tailored specifically for analog input devices, the fundamental methodology can be extended to other product types.

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