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  5. Evaluation of four state-of-the-art power semiconductor devices
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Evaluation of four state-of-the-art power semiconductor devices

Date Issued
May 1, 1990
Author(s)
Sotoudeh, Seyed Yahya
Advisor(s)
B . K. Rose
Additional Advisor(s)
F. Symonds
J.S. Lawler
Permanent URI
https://trace.tennessee.edu/handle/20.500.14382/34234
Abstract

Power semiconductor devices are the most important elements in the design of power electronics circuits. Chapters 2, 3, 4, and 5 of this thesis aim to discuss structures and characteristics of four state-of-the-art power semiconductor devices, i.e., Insulated Gate Bipolar Transistor (IGBT), Static Induction Transistor (SIT), Static Induction Thyristor (SITH), and MOS-Controlled Thyristor (MCT). A one-quadrant chopper circuit with a suitable gate drive circuit is designed for a sample of each one of these devices. The design procedures and the test results are presented at the end of the corresponding chapters. The device test is based on the availability of the sample and limitations of laboratory test equipment. Test results prove the devices' data sheets provide accurate information about static and dynamic characteristics of the devices.

Degree
Master of Science
Major
Electrical Engineering
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Thesis90S686.pdf

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6.39 MB

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Unknown

Checksum (MD5)

f49dcd14443d375df76cecb52ddb88fa


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