Design of a Highly Constrained Test System for a 12-bit, 16-channel Wilkinson ADC

Author

Zachary William Pannell, University of Tennessee - KnoxvilleFollow

Date of Award

12-2009

Degree Type

Thesis

Degree Name

Master of Science

Major

Electrical Engineering

Major Professor

Benjamin J. Blalock

Committee Members

Jeremy H. Holleman, Syed K. Islam

Abstract

Outer space is a very harsh environment that can cause electronics to not operate as they were originally intended. Aside from the extreme amount of radiation found in space, temperatures can also change very dramatically in a relatively small time frame. In order to test electronics that will be used in this environment, they first need to be tested on Earth under replicated conditions. Vanderbilt University designed a dewar that allows devices to be tested at these extreme temperatures while being radiated. For this thesis, a test setup that met all of the dewar's constraints was designed that would allow a 12-bit, 16-channel analog-to-digital converter to be tested while inside.

Recommended Citation

Pannell, Zachary William, "Design of a Highly Constrained Test System for a 12-bit, 16-channel Wilkinson ADC. " Master's Thesis, University of Tennessee, 2009.
https://trace.tennessee.edu/utk_gradthes/549