Date of Award
Master of Science
Benjamin J. Blalock
Charles L. Britton, Syed K. Islam
This thesis presents the analysis, implementation and testing of a circuit-level radiation hardened-by-design (RHBD) technique first presented in . Radiation effects heavily influence the cost and design of electronics bound for radiation-rich environments such as in nuclear reactors or space. The circuit-level RHBD technique is presented as a cost-effective way to mitigate total-ionizing dose (TID) radiation in digital complementary metal-oxide-semiconductor (CMOS) transistor circuits. These claims are analyzed and experimentally tested.
Devices from a relatively old and a newer semiconductor fabrication process are tested to investigate the impact of device scaling on the RHBD technique’s effectiveness. A rad-tolerant frequency synthesizer that implements this technique is discussed. Challenges in the project included implementing efficient testing procedures at the radiation test facilities. Testing time was limited and in-situ test methodologies utilizing LabView programs were used effectively.
Womac, Austin James, "The Characterization of a CMOS Radiation Hardened-by-Design Circuit Technique. " Master's Thesis, University of Tennessee, 2013.