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Markov chain testing models for "sequential-stage system reliability growth via failure mode removal"

Date Issued
May 1, 2003
Author(s)
Corum, Michael W
Advisor(s)
Jesse Poore
Permanent URI
https://trace.tennessee.edu/handle/20.500.14382/41420
Abstract

The goal of this research was to recast the issues raised in "Probability Models for Sequential-Stage System Reliability Growth via Failure Mode Removal" by Gaver, et. al. [I] into Markov chain models as treated by the Software Quality Research Laboratory (SQRL). Solutions given by Gaver were studied and Markov chain testing models were proposed as alternative solutions, providing more questions and answers that are relevant to the testing of sequential-stage systems. Reformulation of the questions yielded solutions in the form of familiar statistics of the Markov chain.

Degree
Master of Science
Major
Computer Science
File(s)
Thumbnail Image
Name

CorumMichael_2003_OCRed.pdf

Size

4.76 MB

Format

Adobe PDF

Checksum (MD5)

b85b3504d9809315c428f70d2871600b


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