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System-on-Chip Design and Test with Embedded Debug Capabilities

Date Issued
August 1, 2006
Author(s)
Marwah, Tushti
Advisor(s)
Donald W. Bouldin
Additional Advisor(s)
Syed Islam
Mohammed Ferdjallah
Permanent URI
https://trace.tennessee.edu/handle/20.500.14382/37628
Abstract

In this project, I started with a System-on-Chip platform with embedded test structures. The baseline platform consisted of a Leon2 CPU, AMBA on-chip bus, and an Advanced Encryption Standard decryption module. The basic objective of this thesis was to use the embedded reconfigurable logic blocks for post-silicon debug and verification.


The System-on-Chip platform was designed at the register transistor level and implemented in a 180-nm IBM process. Test logic instrumentation was done with DAFCA (Design Automation for Flexible Chip Architecture) Inc. pre-silicon tools. The design was then synthesized using the Synopsys Design Compiler and placed and routed using Cadence SOC Encounter. Total transistor count is about 3 million, including 1400K transistors for the debug module serving as on chip logic analyzer. Core size of the design is about 4.8mm x 4.8mm and the system is working at 151MHz. Design verification was done with Cadence NCSim.

The controllability and observability of internal signals of the design is greatly increased with the help of pre-silicon tools which helps locate bugs and later fix them with the help of post-silicon tools. This helps prevent re-spins on several occasions thus saving millions of dollars. Post-silicon tools have been used to program assertions and triggers and inject numerous personalities into the reconfigurable fabric which has greatly increased the versatility of the circuit.

Disciplines
Electrical and Computer Engineering
Degree
Master of Science
Major
Electrical Engineering
Embargo Date
August 1, 2006
File(s)
Thumbnail Image
Name

MarwahTushti.pdf

Size

1.77 MB

Format

Adobe PDF

Checksum (MD5)

0d1046122123ec1c1dba4c2205f04309


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