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A Case Study in CMOS Design Scaling for Analog Applications: The Ringamp LDO

Date Issued
December 1, 2023
Author(s)
Corum, Steven  
Advisor(s)
Benjamin J. Blalock
Additional Advisor(s)
Nicole McFarlane
Garrett Rose
Permanent URI
https://trace.tennessee.edu/handle/20.500.14382/31276
Abstract

As CMOS process nodes scale to smaller feature sizes, process optimizations are made to achieve improvements in digital circuit performance, such as increasing speed and memory, while decreasing power consumption. Unfortunately for analog design, these optimizations usually come at the expense of poorer transistor performance, such as reduced small signal output resistance and increased channel length modulation. The ring amplifier has been proposed as a digital solution to the analog scaling problem, by configuring digital inverters to function as analog amplifiers through deadzone biasing. As digital inverters naturally scale, the ring amplifier is a promising area of exploration for analog design. This work presents a ring amplifier scaling study by demonstration of scaling an output capacitor-less, ring amplifier based low-dropout voltage regulator designed in a standard 180 nm CMOS process down to a standard 90 nm CMOS process.

Subjects

Ringamp

CMOS

Scalable

Analog

Integrated Circuits

Low-Dropout Voltage R...

Disciplines
Electrical and Electronics
VLSI and Circuits, Embedded and Hardware Systems
Degree
Master of Science
Major
Electrical Engineering
File(s)
Thumbnail Image
Name

A_Case_Study_in_CMOS_Design_Scaling_for_Analog_Applications_The_Ringamp_LDO.pdf

Size

15.06 MB

Format

Adobe PDF

Checksum (MD5)

1d6e423258e3e285407d4c90bca72ef0


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