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  5. Infrared spectral line intensities of ethylene
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Infrared spectral line intensities of ethylene

Date Issued
December 1, 1993
Author(s)
Ewing, Alan C.
Advisor(s)
W. E. Blass
Additional Advisor(s)
Stephen J. Daunt
Tom Handler
Permanent URI
https://trace.tennessee.edu/handle/20.500.14382/33235
Abstract

Spectra of the v7 band of ethylene were recorded using a tunable diode laser spectrometer and their linewidths were measured. Spectra acquired at pressures between 10 and 50 milliTorr and in a 45 cm cell are analyzed. Temperature is also accurately recorded. Line intensities are retrieved from the observed line widths. A broad band spectrum acquired at the Kitt Peak National Observatory on a Fourier transform spectrometer was also studied. TDL line intensities are used to calibrate the FTS data , and CO2 lines present in the FTS spectrum are used to calibrate line positions. A corrected pressure is determined and a series of line strengths from the Fourier transform spectra is reported

Degree
Master of Science
Major
Physics
File(s)
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Thesis93E955.pdf

Size

2.89 MB

Format

Unknown

Checksum (MD5)

b85cec882841900ca1691256c6d4fc4f

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