Designing testability into a digital system

A survey of the literature was conducted to determine various testing techniques being used in industry for testing digital equipment. Emulation, In-circuit, LSSD, and concurrent testing schemes were explored in detail.

A general purpose microprogrammable controller was designed and the potential for using various testing schemes was considered. The concurrent testing scheme was used to test the operation of the con troller and signature analysis was used for isolating faults.

This thesis discusses the importance of devising testability into present digital systems.