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  5. Development of a circuit that linearizes the response of a Platinum Resistance Temperature Detector
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Development of a circuit that linearizes the response of a Platinum Resistance Temperature Detector

Date Issued
August 1, 1985
Author(s)
Pabon, Gus C.
Advisor(s)
T. Vaughn Blalock
Additional Advisor(s)
Eldredge J. Kennedy
James M. Rochelle
Permanent URI
https://trace.tennessee.edu/handle/20.500.14382/35698
Abstract

This thesis presents the development and analysis of a signal processor that linearizes the response of a Platinum Resistance Temperature Detector, commonly referred to as RTD.


The function of the RTD Processor is to accurately measure temperature in any resistance thermometry application which uses the RTD as a temperature transducer. The characteristic change of the RTD's electrical resistance with temperature makes possible this measurement; however, a linearizing circuit is needed because the resistance change with temperature is not linear.

Calculated results show that the circuit is capable of producing a temperature inaccuracy of 0.005% of full scale temperature for 0 to 200%deg;C and 0.05% inaccuracy of full scale temperature for the range of 0 to 600°C. Experimental results confirm the linearity of the output response of the circuit and are correlated with predicted results given in this thesis. The maximum error encountered in experimentation was 0.02% of full scale temperature for the range of 0 to 200°C.

Degree
Master of Science
Major
Electrical Engineering
File(s)
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Thesis85P236.pdf

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5.3 MB

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Unknown

Checksum (MD5)

9881aa1b16ded458e2c5c7561f5b727d

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