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  5. Development of a circuit that linearizes the response of a Platinum Resistance Temperature Detector
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Development of a circuit that linearizes the response of a Platinum Resistance Temperature Detector

Date Issued
August 1, 1985
Author(s)
Pabon, Gus C.
Advisor(s)
T. Vaughn Blalock
Additional Advisor(s)
Eldredge J. Kennedy, James M. Rochelle
Abstract

This thesis presents the development and analysis of a signal processor that linearizes the response of a Platinum Resistance Temperature Detector, commonly referred to as RTD.


The function of the RTD Processor is to accurately measure temperature in any resistance thermometry application which uses the RTD as a temperature transducer. The characteristic change of the RTD's electrical resistance with temperature makes possible this measurement; however, a linearizing circuit is needed because the resistance change with temperature is not linear.

Calculated results show that the circuit is capable of producing a temperature inaccuracy of 0.005% of full scale temperature for 0 to 200%deg;C and 0.05% inaccuracy of full scale temperature for the range of 0 to 600°C. Experimental results confirm the linearity of the output response of the circuit and are correlated with predicted results given in this thesis. The maximum error encountered in experimentation was 0.02% of full scale temperature for the range of 0 to 200°C.

Degree
Master of Science
Major
Electrical Engineering
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Thesis85.P236.pdf_AWSAccessKeyId_AKIAYVUS7KB2IXSYB4XB_Signature_YvzxcWoNGH_2FPgoQoEORVaOZ7nG8_3D_Expires_1756569504

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5.3 MB

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Checksum (MD5)

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